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Resolution: standard / high Figure 1.
SEM images and AFM images. (a) SEM image showing the surface morphology of Si-based AAO, (b) AFM image of Si substrates after eroding the AAO structure and standard RCA cleaning,
(c) AFM image of the nanotip-patterned Si substrates.
Tang et al. Nanoscale Research Letters 2012 7:346 doi:10.1186/1556-276X-7-346 |
