Resolution:
standard / ## Figure 7.
Typical I-V hysteresis loop of S1 and S2 devices and cumulative probability of leakage
currents. Typical I-V hysteresis loop with 100 consecutive cycles under a CC of 500 μA for
(a) S1 and (b) S2 devices. (c) Cumulative probability of leakage currents for S1 and S2 devices.
Rahaman |