Download references

Open Access Highly Accessed Open Badges

Excellent resistive memory characteristics and switching mechanism using a Ti nanolayer at the Cu/TaOx interface

Sheikh Ziaur Rahaman, Siddheswar Maikap*, Ta-Chang Tien, Heng-Yuan Lee, Wei-Su Chen, Frederick T Chen, Ming-Jer Kao and Ming-Jinn Tsai

Nanoscale Research Letters 2012, 7:345  doi:10.1186/1556-276X-7-345