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Excellent resistive memory characteristics and switching mechanism using a Ti nanolayer at the Cu/TaOx interface

Sheikh Z Rahaman, Siddheswar Maikap*, Ta-Chang Tien, Heng-Yuan Lee, Wei-Su Chen, Frederick T Chen, Ming-Jer Kao and Ming-Jinn Tsai

Nanoscale Research Letters 2012, 7:345 doi:10.1186/1556-276X-7-345

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