Figure 3.

XRD peak intensity ratio and optical transparency at 1,000 nm for Nb-Ge-O thin films. In this case, the XRD peaks of NbO2 at the (400) reflection and Nb2O5 at (001) are employed.

Abe Nanoscale Research Letters 2012 7:341   doi:10.1186/1556-276X-7-341
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