|
Resolution: standard / high Figure 3.
XRD peak intensity ratio and optical transparency at 1,000 nm for Nb-Ge-O thin films. In this case, the XRD peaks of NbO2 at the (400) reflection and Nb2O5 at (001) are employed.
Abe Nanoscale Research Letters 2012 7:341 doi:10.1186/1556-276X-7-341 |
