Figure 1.

XRD pattern of Nb-Ge-O thin films with different Ge contents. Dots indicate orthorhombic Nb2O5, circles indicate NbO2, and squares indicate Ge. Labels A through D indicate Ge concentrations of 0, 1.8 at.%, 4.9 at.%, and 5.5 at.%.

Abe Nanoscale Research Letters 2012 7:341   doi:10.1186/1556-276X-7-341
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