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Resolution: standard / high Figure 6.
On currents and 52° tilted SEM image of a NW device. (a) On currents, extracted at VG − Vth = 2 V and VD = 0.5 V, as a function of channel length for DC and UC devices. (b) 52° tilted SEM image of a NW device with L = 5 μm showing collapse of NWs in the central channel region. The inset shows a NW
device with L = 1 μm depicting normal suspension of NWs between the S/D regions.
Su et al. Nanoscale Research Letters 2012 7:339 doi:10.1186/1556-276X-7-339 |
