Table 2 |
||
| Comparison of metrological properties of different systems | ||
| System | Movement (nm) | Rotation (μrad) |
| CRB stage | 0.4 | 0.005 |
| Flexure stage | 3.8 | 0.45 |
| Commercial SPM | 2 | 2 |
| Stack piezo | 27 | 40 |
Comparison of parasitic motion and rotation error for different actuators. Note that for the CRB stage, the parasitic motion could not be measured, as the system could not be disassembled; the values are taken from a single stage datasheet. For the flexure stage, it was measured with one axis fixed. For the commercial SPM, the estimate is taken from AFM measurements of a calibration standard.
Klapetek et al. Nanoscale Research Letters 2012 7:332 doi:10.1186/1556-276X-7-332