Figure 4.

High-frequency (1 MHz) capacitance-voltage curves for TiO2/ZrO2/Si thin films. The inverted triangle represents the as-deposited sample; square, the sample annealed at 573 K; circle, the sample annealed at 773 K; and triangle, the sample annealed at 973 K.

Dong et al. Nanoscale Research Letters 2012 7:31   doi:10.1186/1556-276X-7-31
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