The cross sectional HR-TEM images. (a) as-deposited poly Ge and (b) Ge dot with laser energy of 700 mJ/cm2. The inset of (b) shows the cross-sectional TEM image of Ge dots. The crystallization quality of Ge dot is also improved as compare with as-deposited poly Ge. (c) The compositions of intermediate layer and dot by EDS after laser annealing. The Ge content of intermediate layer and dot are 49% and 93%, respectively.
Lee and Chen Nanoscale Research Letters 2012 7:307 doi:10.1186/1556-276X-7-307