Figure 2.
Top-view SEM of as-deposited poly Ge by UHV-CVD (a) and Ge nano-dot formation procedure
(b). Due to the properties of low melting point and higher nucleation process of Ge, dots
were self-assembled and formatted dots by the SK growth mode.
Lee and Chen Nanoscale Research Letters 2012 7:307 doi:10.1186/1556-276X-7-307 |