Figure 3.

SEM and AFM images of typical graphene-on-silicon devices. SEM top view (a) and cross section view (b) images of the typical graphene-on-silicon devices. The inset in (a) displays the AFM image of the graphene flakes obtained from the supernatant.

Mohammed et al. Nanoscale Research Letters 2012 7:302   doi:10.1186/1556-276X-7-302
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