Figure 3.
SEM and AFM images of typical graphene-on-silicon devices. SEM top view (a) and cross section view (b) images of the typical graphene-on-silicon devices. The inset in (a) displays the
AFM image of the graphene flakes obtained from the supernatant.
Mohammed et al. Nanoscale Research Letters 2012 7:302 doi:10.1186/1556-276X-7-302 |