The RT in-plane strain depth profiles for samples S1 (a) and S2 (b). Solid lines, theoretical; dashed lines, experimental. Horizontal lines 1 and 2 show the theoretical and experimental average strain in the SL layers for samples S1 and S2, respectively.
Kladko et al. Nanoscale Research Letters 2012 7:289 doi:10.1186/1556-276X-7-289