X-ray diffraction patterns of GCs and PGs. (a) Rietveld analyses for XRD pattern of GCs and the error curve. (b) The calculated line spectrum from peak area of GCs and (c) the simulated line spectrum of GCs from the Diamond program are presented for comparison.
Yu et al. Nanoscale Research Letters 2012 7:275 doi:10.1186/1556-276X-7-275