Figure 6.

TEM BFI and SAED pattern of tenorite in PLA sample after prolonged dwelling in water. Note the slightly preferred orientation of the assembled tenorite nanoparticles in region I to show the (002) and {111} diffraction arcs. The sample was dwelled in water for 20 days after PLA treatment. The Ni counts are from the sample supporting the nickel grid.

Lin et al. Nanoscale Research Letters 2012 7:272   doi:10.1186/1556-276X-7-272
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