Figure 2.

SEM images and EDS analysis. The SEM images of ( a) Ag nanoislands which were fabricated by rf sputtering and ( b) Si nanopillars. The inset in ( a) is EDS analysis of Ag nanoislands on the Si substrate.

Chiang and Dai Nanoscale Research Letters 2012 7:263   doi:10.1186/1556-276X-7-263
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