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Resolution: standard / high Figure 5.
Experimental verification of enhanced bendability of ITO-based thin films according
to thetbof PI. (a) Two-probe resistance and (b) maximum stress of ITO layer for PI/ITO/PES on bending curvature κ (σy: yield strength).
Lee et al. Nanoscale Research Letters 2012 7:256 doi:10.1186/1556-276X-7-256 |
