Figure 5.

Experimental verification of enhanced bendability of ITO-based thin films according to thetbof PI. (a) Two-probe resistance and (b) maximum stress of ITO layer for PI/ITO/PES on bending curvature κ (σy: yield strength).

Lee et al. Nanoscale Research Letters 2012 7:256   doi:10.1186/1556-276X-7-256
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