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Resolution: standard / high Figure 6.
Comparison of morphologies of WAW multilayer and ITO. AFM image and surface roughness (root mean square and peak-to-valley) of solution-processed
WAW multilayer and conventional ITO. Rrms, rms surface roughness; Rpv, peak-to-valley roughness.
Jeon et al. Nanoscale Research Letters 2012 7:253 doi:10.1186/1556-276X-7-253 |
