Figure 4 .
Test error vs. number of iterations and ANN estimation. (a) Test error vs. number of iterations in the ANN learning process for different ANN inputs. (b) ANN estimation of the thin film dielectric constant for the test set for the case where F vs. D, ϵ2, and h1 are included as inputs.
Castellano-Hernández et al. Nanoscale Research Letters 2012 7:250 doi:10.1186/1556-276X-7-250