Figure 2 .
Potential distribution around an EFM tip. 3D representation of the potential distribution around an EFM tip (L = 10 R, θ = 20°) over a dielectric sample (D = 0.1 R, ϵ = 10) as a function of the ANN iterations in the learning process Nit. 2D equipotential distribution in the middle of the image corresponds to the results obtained by the standard LSM.
Castellano-Hernández et al. Nanoscale Research Letters 2012 7:250 doi:10.1186/1556-276X-7-250