Figure 1.

Layer thickness. Thickness of the gold layer deposited on the glass and Si substrates as a function of the deposition time determined by RBS and AFM methods. For RBS data, measuring statistical errors of about 1 % are not shown. Note that the thicknesses are given in atom area density and in nanometers for RBS and AFM data, respectively. The area density can be converted into nanometers by multiplying it with an approximate factor of 0.1695.

Malinský et al. Nanoscale Research Letters 2012 7:241   doi:10.1186/1556-276X-7-241
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