Figure 5.

Refractive index of a-Si1-xCx passivation layer as a function of the Si target's RF power. (a) Refractive index, n. (b) One point of refractive index, n (630 nm).

Joung et al. Nanoscale Research Letters 2012 7:22   doi:10.1186/1556-276X-7-22
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