Figure 2.

Out-of-plane intensity distribution in reciprocal space. Intensities along the CTRs (10L)hex and (20L)hex measured in situ (a, b) and calculated (c, d) as a function of nominal layer thickness. Each CTR intersects two substrate reflections. The red arrows point to the beginning of crystal layer formation.

Hanke et al. Nanoscale Research Letters 2012 7:203   doi:10.1186/1556-276X-7-203
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