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Resolution: standard / high Figure 1.
The PL and EL intensities of Si/SiO samples versus thickness of Si interlayer, dSi. The dashed curves are for PL intensities after R correction. The inset gives the turn-on voltage versus dSi.
Li et al. Nanoscale Research Letters 2012 7:200 doi:10.1186/1556-276X-7-200 |
