More detailed measurements of the leaf-like nanostructures. (a) TEM images of the brightfield and darkfield parts of the leaf-like nanostructures, and the inset is the TEM photograph of a small part of the leaf-like sample. (b) HRTEM image with which the insets in (b) are the corresponding FFT images taken at the different square areas in the HRTEM image. EDS patterns (c) and (d) at the two circle regions corresponding to the darkfield and brightfield regions, respectively, in the TEM image.
Fang et al. Nanoscale Research Letters 2012 7:197 doi:10.1186/1556-276X-7-197