Figure 4.

The cross-sectional TEM and HRTEM images. (a) Cross-sectional TEM image of an IrOx/Al2O3 /IrOx-NDs/Al2O3/WOx/W ReRAM device with a device size of 8 × 8 μm2. (b) HRTEM image of the stack layers.

Banerjee et al. Nanoscale Research Letters 2012 7:194   doi:10.1186/1556-276X-7-194
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