|
Resolution: standard / high Figure 8.
Device-to-device uniformities of ten samples fabricated at RT under the bipolar resistive
switching mode. Including the set and reset voltages and the LRS and HRS currents measured at ±
0.1 V.
Lin et al. Nanoscale Research Letters 2012 7:187 doi:10.1186/1556-276X-7-187 |
