Figure 7.

Retention time of the sample fabricated at RT. LRS and HRS currents measured at ± 0.1 V firmly hold on about 6 mA and 2 × 10-8 A, respectively, for over 106 s without applying any power supply, so the good nonvolatility of the sample is demonstrated.

Lin et al. Nanoscale Research Letters 2012 7:187   doi:10.1186/1556-276X-7-187
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