Figure 4.

AFM images. Images are shown for 10 μm by 10 μm region of the graphene layer surface for various orientations of the SiC faces grown at 1,450°C for 60 min. The height scale is displayed at the right side of each image.

Kim et al. Nanoscale Research Letters 2012 7:186   doi:10.1186/1556-276X-7-186
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