Figure 4.

AFM results. (a) AFM image of the ZnO film surface grown at 150°C. (b) AFM image of the ZnO film surface grown at 420°C. (c) The evolution of surface roughness as a function of substrate temperature. (d) The evolution of XRD FWHM values as a function of substrate temperature.

Zhou et al. Nanoscale Research Letters 2012 7:184   doi:10.1186/1556-276X-7-184
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