Figure 3.

Crystalline properties of the samples characterized by HRXRD. Experimental XRD pattern of a 100-period InAs/GaSb SL sample (a). Dynamical simulation to pattern (a) with the fitting parameter x = 0.1 (b). Dynamical simulation with the fitting parameter x = 0.18, making the SL match the completely GaSb substrate (c).

Li et al. Nanoscale Research Letters 2012 7:160   doi:10.1186/1556-276X-7-160
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