|
Resolution: standard / high Figure 3.
Crystalline properties of the samples characterized by HRXRD. Experimental XRD pattern of a 100-period InAs/GaSb SL sample (a). Dynamical simulation
to pattern (a) with the fitting parameter x = 0.1 (b). Dynamical simulation with the fitting parameter x = 0.18, making the SL match the completely GaSb substrate (c).
Li et al. Nanoscale Research Letters 2012 7:160 doi:10.1186/1556-276X-7-160 |
