Table 1

Atomic structure parameters of bulk SiO2, clean SiO2(0001) surface, and graphene/SiO2(0001) interface

Measurement

Bulk SiO2

Clean SiO2 slab

Graphene/SiO2 (structure A)


d0 (Å)

2.820

d1 (Å)

1.798

1.685

1.619

l0 (Å)

1.596

1.620

1.616

α1 (°)

146.529

137.140

135.932

lC-C (Å)

1.430


d1 is the distance between the first and the second Si atom layers; l0 is the length of Si-O bond on the surface or interface; α1 is the value of the Si-O-Si angle; lC-C is the average bond length of C-C.

Ao et al. Nanoscale Research Letters 2012 7:158   doi:10.1186/1556-276X-7-158

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