Figure 1.

Typical continuous load-depth data. Data obtained from c-plane (0001), a-plane (11-20), and m-plane (10-10) GaN crystals performed with a Berkovich tip (a) and a conical tip (b). The insets are the magnified views of the pop-in events.

Huang et al. Nanoscale Research Letters 2012 7:150   doi:10.1186/1556-276X-7-150
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