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Resolution: standard / high Figure 2.
Plane-view TEM micrographs of Ge-NC. Embedded in (a) Al2O3 matrix (sample 'RA'), (b) HfO2 matrix (sample 'RF').
Das et al. Nanoscale Research Letters 2012 7:143 doi:10.1186/1556-276X-7-143 |
