Figure 1.

Plane-view TEM micrograph of Ge nanocrystals embedded in SiO2 matrix for the sample. (a) 'RS-1', (b) 'RS-2', and (c) 'RS-3'.

Das et al. Nanoscale Research Letters 2012 7:143   doi:10.1186/1556-276X-7-143
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