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Resolution: standard / high Figure 1.
Plane-view TEM micrograph of Ge nanocrystals embedded in SiO2 matrix for the sample. (a) 'RS-1', (b) 'RS-2', and (c) 'RS-3'.
Das et al. Nanoscale Research Letters 2012 7:143 doi:10.1186/1556-276X-7-143 |
