Figure 4.

Images of a Bi-Ni nanowire (a) and nanocable (b) obtained using STEM. STEM HAADF images of (i) a Bi-Ni nanowire and nanocable and (ii) after an EDS image scan of the marked area in (i). Elemental mapping of the (iii) nickel and (iv) bismuth X-ray intensities compositing along the nanowire and nanocable.

Jia et al. Nanoscale Research Letters 2012 7:130   doi:10.1186/1556-276X-7-130
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