Scan speed control for tapping mode SPM
- Equal contributors
1 Faculty of Automation and Electronics of the National Nuclear Research University (MEPhI), Moscow, 115409, Russia
2 Department of Physical and Mechanical Properties Research of Federal State Institution, Technological Institute for Superhard and Novel Carbon Materials, Troitsk, 142190, Russia
Nanoscale Research Letters 2012, 7:121 doi:10.1186/1556-276X-7-121Published: 14 February 2012
In order to increase the imaging speed of a scanning probe microscope in tapping mode, we propose to use a dynamic controller on 'parachuting' regions. Furthermore, we propose to use variable scan speed on 'upward step' regions, with the speed determined by the error signal of the closed-loop control. We offer line traces obtained on a calibration grating with 25-nm step height, using both standard scanning and our scanning method, as experimental evidence.