Figure 8.

I-V characteristics and the average electrical resistance of the CuO nanowire sample. (a) I-V characteristics of the CuO nanowire sample measured at different environmental temperatures. The inset shows a schematic illustration of CuO nanowire device configuration. (b) The average electrical resistance of the CuO nanowire sample as a function of environmental temperature.

Cheng and Chen Nanoscale Research Letters 2012 7:119   doi:10.1186/1556-276X-7-119
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