I-V characteristics and the average electrical resistance of the CuO nanowire sample. (a) I-V characteristics of the CuO nanowire sample measured at different environmental temperatures. The inset shows a schematic illustration of CuO nanowire device configuration. (b) The average electrical resistance of the CuO nanowire sample as a function of environmental temperature.
Cheng and Chen Nanoscale Research Letters 2012 7:119 doi:10.1186/1556-276X-7-119