Figure 6.

Average length and square of the length of the CuO nanowires versus annealing time curves. (a) The average length and (b) square of the length of CuO nanowires versus annealing time curves for the electrodeposited Cu film-coated Si samples oxidized at 400°C to 500°C.

Cheng and Chen Nanoscale Research Letters 2012 7:119   doi:10.1186/1556-276X-7-119
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