Figure 4.

TEM images, SAED patterns, HRTEM image, and EDS line-scan profile of the CuO nanowires. (a), (b), and (c) show representative bright-field TEM images of three individual CuO nanowires. The insets show the corresponding indexed SAED patterns. (d) TEM image of an individual CuO nanowire. The inset shows the corresponding FFT-filtered lattice images from the outlined region marked in (d). (e) TEM image and the EDS line-scan profiles of the CuO nanowire. The inset shows the corresponding spot EDS spectrum.

Cheng and Chen Nanoscale Research Letters 2012 7:119   doi:10.1186/1556-276X-7-119
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