Open Access Nano Express

Electrical characterization and nanoscale surface morphology of optimized Ti/Al/Ta/Au ohmic contact for AlGaN/GaN HEMT

Cong Wang and Nam-Young Kim*

Nanoscale Research Letters 2012, 7:107 doi:10.1186/1556-276X-7-107

Accesses  

  • Last 30 days: 108 accesses
  • Last 365 days: 968 accesses
  • All time: 1351 accesses

Cited by

Google Scholar: View citations

ISI Web of Science: View citations

PubMed Central: View citations