SEM of a CNT bump growth using the PECVD approach. The grown CNT was vertically aligned, and the length of the CNT was 20 μm. The top right (inset) shows the low magnification view of the CNT bumps formed on the Au metal lines.
Yap et al. Nanoscale Research Letters 2012 7:105 doi:10.1186/1556-276X-7-105