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Resolution: standard / high Figure 5.
(a) AFM image (2 × 2 μm2) from the Ge0.96Sn0.04 film with 1.58 nm thickness, grown at 450°C. (b) The dependence of quantity ND on the lateral size.
Mashanov et al. Nanoscale Research Letters 2011 6:85 doi:10.1186/1556-276X-6-85 |
