Figure 1.

AFM images of device surfaces. (a) With as-grown InAs QDs and without AlAs layers (sample A), (b) with as-grown InAs QDs and AlAs layers (sample B), (c) with annealed InAs QDs and without AlAs layers (sample C), and (d) with annealed InAs QDs and AlAs layers (sample D).

Hu et al. Nanoscale Research Letters 2011 6:83   doi:10.1186/1556-276X-6-83
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