Figure 3.

Measured wire resistance versus the wire radius for a IV/III ratio of 0.08 for two different annealing cycles. The resistance is normalized to wires with 1-μ length. In addition, modeled data for three different carrier concentrations (5 × 1017 cm-3, 1 × 1018 cm-3, 2 × 1018 cm-3) are given in dashed lines.

Gutsche et al. Nanoscale Res Lett 2011 6:65   doi:10.1007/s11671-010-9815-7