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Resolution: standard / high Figure 1.
a–e SEM top views (and cross-sections in insets) of samples 1, 2, 3, 4 and 5, respectively; f SEM bottom view (and bottom side view in inset) of sample 1.
Cao et al. Nanoscale Res Lett 2011 6:64 doi:10.1007/s11671-010-9812-x |
