EDX analysis and bright field TEM image. (a) EDX analysis of an etched and unetched SRO/PCMO/SRO flat trilayer structure. (b) Bright field TEM image of the flat layer stack on the substrate after etching. The measured thicknesses were used in the simulation of the XRD spectra of the microtubes obtained from this trilayer (Figure 4).
Deneke et al. Nanoscale Research Letters 2011 6:621 doi:10.1186/1556-276X-6-621