Figure 2.

O K edge (532 eV) spectra collected through the SiO2/Co interface. The spectra were collected for deposits 1 (a) and 2 (b). As the probe scans through the SiO2 substrate, the interface between both materials, and finally the inner part of the deposit, the O K edge changes its shape (apparition of a small pre-peak, pointed with an arrow), practically disappearing at the inside of the microstructure for deposit 2.

C√≥rdoba et al. Nanoscale Research Letters 2011 6:592   doi:10.1186/1556-276X-6-592
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