|
Resolution: standard / high Figure 2.
O K edge (532 eV) spectra collected through the SiO2/Co interface. The spectra were collected for deposits 1 (a) and 2 (b). As the probe scans through the SiO2 substrate, the interface between both materials, and finally the inner part of the
deposit, the O K edge changes its shape (apparition of a small pre-peak, pointed with
an arrow), practically disappearing at the inside of the microstructure for deposit
2.
Córdoba et al. Nanoscale Research Letters 2011 6:592 doi:10.1186/1556-276X-6-592 |
