Table 1

Atomic concentrations

AU layer thickness

Temperature

Atomic concentrations of elements in at.%

C

C^PTFE

O

Au

F

F/C^PTF

20 nm

RT

43.5

4.4

6.5

41.6

8.5

1.93

300°C

37.8

34.8

0.4

3.4

58.4

1.68

80 nm

RT

41.0

3.1

4.4

48.6

6.0

1.94

300°C

36.8

27.2

1.2

14.8

47.2

1.74

Atomic concentrations (in atomic percent) of C (1s), O (1s), Au (4f), and F(1s) in Au-sputtered PTFE samples with Au effective thickness 20 and 80 nm after deposition (RT) a after annealing (300°C) measured by XPS. C^PTFE, calculated concentration from XPS data of carbon (in atomic percent) originating from PTFE only; F/C^PTFE, stands for fluorine to PTFE carbon ratio.

Siegel et al. Nanoscale Research Letters 2011 6:588   doi:10.1186/1556-276X-6-588