Figure 2.

Normalized XPS spectra. Intensity normalized XPS spectra (line Au (4f)) of 20-nm (A) and 80-nm (B) thick sputtered Au layers on PTFE before (black line) and after (blue line) annealing at 300°C.

Siegel et al. Nanoscale Research Letters 2011 6:588   doi:10.1186/1556-276X-6-588
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