|
Resolution: standard / high Figure 2.
Normalized XPS spectra. Intensity normalized XPS spectra (line Au (4f)) of 20-nm (A) and 80-nm (B) thick sputtered Au layers on PTFE before (black line) and after (blue line) annealing
at 300°C.
Siegel et al. Nanoscale Research Letters 2011 6:588 doi:10.1186/1556-276X-6-588 |
